Measurement modes: Motion patterns at the measurements: - area (matrix); - line; - single point. |
- Contact static AFM
- Lateral force microscopy /with contact static AFM/
- Non-contact dynamic AFM
- Intermittent contact AFM (similar to Tapping Mode®)
- Phase contrast imaging /with intermittent contact AFM/
- Two-pass mode (for static and dynamic AFM)
- Two-pass mode with varying separation (for static and dynamic AFM) /Original technique!/
- Multicycle scanning (for static and dynamic AFM) /Original technique!/
- Multilayer scanning with varying load (for static and dynamic AFM) /Original technique!/
- Electrostatic force microscopy (two-pass technique) , **
- Current mode , **
- Magnetic force microscopy (two-pass technique) *, **
- Static force spectroscopy (with calculation of quantitative parameters, surface energy and elastic modulus in the measurement point)
- Dynamic force spectroscopy
- Dynamic frequency force spectroscopy /Original technique!/
- Nanoindentation
- Nanoscratching
- Linear nanowear
- Nanolithography (with control of <i> load, <ii> depth and <iii> bias voltage)
- Microtribometry /Original technique!/
- Microadhesiometry /Original technique!/
- Shear-force microtribometry /Original technique!/
- Temperature-dependent measurements (under all above modes)
Note. * - or rig required ** - Specialized probes required |
Scan field area: |
from 5x5 micron up to 50x40 microns |
Maximum range of measured heights: |
from 2 to 4 micron |
Lateral resolution (plane XY): |
1–5 nm (depending on sample hardness) |
Vertical resolution (direction Z): |
0.1–0.5 nm (depending on sample hardness) |
Scanning matrix: |
Up to 1024x1024 points |
Scan rate: |
40–250 points per second in X-Y plane |
Nonlinearity correction : |
A software nonlinearity correction provided |
Minimum scanning step: |
0.3 nm |
Scanning scheme: |
The sample is moved in X-Y plane (horizontal) and in Z-direction (vertical) under stationary probe. |
Scanner type: |
A piezoceramic tube. |
Cantilevers (probes): |
Commercial AFM cantilevers of 3.4x1.6x0.4 mm. Recommended are probes from or . Checked for operation with probes by and |
Cantilever deflection detection system: |
Laser beam scheme with four-quadrant position-sensitive photodetector |
Sample size: |
Up to 30x30x8 mm (w–d–h); extending allows measurement of samples with height up to 35 mm |
High voltage amplifier output: |
+190 V |
ADC: |
16 bit |
Operation environment: |
Open air, 760+40 mm Hg col., T = 22+4°С, relative humidity <70% |
Range of automated movement of measuring head: |
10x10 mm in XY plane for micropositioning of probe relative measured sample at step 2.5 micron with optical visual monitoring |
Overall dimensions: |
Scanning unit: 185x185x290 mm Control electronic unit: 195x470x210 mm |
Field of view of embedded videosystem: |
1x0.75 mm, visualization window 640x480 pixel, frame rate up to 30 fps. |
Vibration isolation: |
Additional antivibration table is recommended |
Host computer: |
Not less than: Celeron® 2.2, RAM 256 MB, HDD 80 GB, VRAM 128 MB, monitor 17" 1024x768x32 bit, Windows® XP SP1, 2 USB port. Recommended: Core i5 or equivalent, RAM 2 GB, HDD 320 GB, VRAM 1 GB, monitor 1600x1200x32 bit, Windows® XP SP2 or higher, 2 free USB port. |
Software: |
Special and the AFM image processing package / are included. |